X-Ray Diffraction for Materials Research. From Fundamentals to Applications, Paperback - ***

Detalii:

This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes howPublisher: Apple Academic Press Inc.Author(s): Myeongkyu (Point Pleasant, New Jersey, USA) LeeIllustration(s): 219 Illustrations, black and whiteNumber of pages: 302Publication date: 2021Dimensions: 150 x 228 x 19Cover type: Paperback / softback

Preț:

539.09 ^RON

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Alte detalii:

Vânzător: Elefant.ro
Brand: Apple Academic Press Inc.